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SEMICON West – Test in Transition: Changing Customer Requirements

If you are investing in the ATE (Automated Test Equipment) sector there’s a must read series of presentations at this link:

SEMICON West – TechXPOT North Two: Test in Transition: Changing Customer Requirements.

Several comments from the presentation made by Dale Omhart (Texas Instruments) really stood out:

Test contribution to total semiconductor manufacturing costs continues to INCREASE

Memory [...]